Grain-boundary-controlled current transport in copper phthalocyanine
- 17 April 2006
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 88 (16) , 162110
- https://doi.org/10.1063/1.2196479
Abstract
Anomalous temperature dependence of resistivity at low temperature is observed in copper-phthallocyanine thin film. A model based on grain-boundary-controlled transport has been developed for the explanation of the observed anomaly. The prediction is based on the assumption that the thin film beyond a certain thickness is mainly polycrystalline, consisting of grains. The transport is expected to be limited by potential barriers at grain boundaries.Keywords
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