Surface Characterization of EMA Copolymers Using XPS and ToF-SIMS
- 1 June 1996
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 24 (6) , 380-388
- https://doi.org/10.1002/(sici)1096-9918(199606)24:6<380::aid-sia128>3.0.co;2-3
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Surface characterization of EVA copolymers and blends using XPS and ToF-SIMSSurface and Interface Analysis, 1994
- Static secondary ion mass spectrometric investigation of the surface chemistry of organic plasma-deposited films created from oxygen-containing precursors. 3. Multivariate statistical modelingAnalytical Chemistry, 1993
- Analysis of polymer surfaces by SIMS: Part 15. Oxygen‐functionalized aliphatic homopolymersSurface and Interface Analysis, 1992
- Surface characterization of 2-hydroxyethyl methacrylate/styrene copolymers by angle-dependent X-ray photoelectron spectroscopy and static secondary ion mass spectrometryJournal of Biomaterials Science, Polymer Edition, 1992
- Surface characterization of butyl methacrylate polymers by XPS and static SIMSSurface and Interface Analysis, 1990
- SSIMS analysis of methacrylate copolymers employed in drug deliveryJournal of Applied Polymer Science, 1990
- A Static‐Secondary‐Ion‐Mass‐Spectrometry study of the surfaces of poly(hydroxyalkyl methacrylates) before and after chemical modificationRecueil des Travaux Chimiques des Pays-Bas, 1990
- Recent advances in secondary lon mass spectrometry (SIMS) for polymer surface analysisBritish Polymer Journal, 1989
- Analysis of polymer surfaces by SIMS. 12. On the fragmentation of acrylic and methacrylic homopolymers and the interpretation of their positive and negative ion spectraSurface and Interface Analysis, 1988
- Analysis of polymer surfaces by SIMS. 2—fingerprint spectra from simple polymer filmsSurface and Interface Analysis, 1982