Solid-State Energy-Dispersion Spectrometer for Electron-Microprobe X-ray Analysis
- 2 February 1968
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 159 (3814) , 528-530
- https://doi.org/10.1126/science.159.3814.528
Abstract
Improved lithium-drifted silicon solid-state detectors allow detection and energy dispersion of x-rays of about 3 to 30 kiloelectron volts in the electron-microprobe x-ray analyzer. Energy resolution is sufficient to separate peaks of characteristic x-rays of elements adjacent in the periodic system at atomic number 20 and higher. The detected x-ray spectrum emitted from an unknown sample can be recorded with a multichannel analyzer in approximately 60 seconds.Keywords
This publication has 3 references indexed in Scilit:
- Application of High-Resolution Semiconductor Detectors in X-ray Emission SpectrographyScience, 1966
- Use of a Multichannel Analyzer for Electron Probe Microanalysis.Analytical Chemistry, 1963
- Some Methods for analysing unresolved Proportional Counter Curves of X-ray Line SpectraProceedings of the Physical Society, 1959