Determining refractive index and thickness of thin films from wavelength measurements only
- 1 August 1985
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 2 (8) , 1339-1343
- https://doi.org/10.1364/josaa.2.001339
Abstract
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This publication has 3 references indexed in Scilit:
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- Determination of the thickness and optical constants of amorphous siliconJournal of Physics E: Scientific Instruments, 1983
- A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin filmJournal of Physics E: Scientific Instruments, 1976