Use of a Scanning Laser Beam for Thin Film Control and Characterization
- 1 August 1980
- journal article
- Published by Taylor & Francis in Optica Acta: International Journal of Optics
- Vol. 27 (8) , 1267-1274
- https://doi.org/10.1080/713820373
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Flash evaporation of compounds with a pulsed-discharge CO_2 laserApplied Optics, 1976
- Optical Thickness Monitor for Thin Film DepositionApplied Optics, 1975
- La détermination de l'indice et de l'épaisseur des couches minces transparentesJournal de Physique et le Radium, 1950