Direct Measurement of Mobility of Edge and Screw Dislocations in 3% Silicon-Iron by High Voltage Transmission Electron Microscopy
- 1 March 1972
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 32 (3) , 702-716
- https://doi.org/10.1143/jpsj.32.702
Abstract
No abstract availableKeywords
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