ESD protection elements during hbm stress tests—further numerical and experimental results

This publication has 4 references indexed in Scilit:

• Analysis of HBM ESD testers and specifications using a fourth‐order lumped element model
  Quality and Reliability Engineering International, 1994
• Compact electro‐thermal simulation of ESD‐protection elements
  Quality and Reliability Engineering International, 1994
• Integrierte Mikrowellenschaltungen
  Published by Springer Nature ,1983
• Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse Voltages
  IEEE Transactions on Nuclear Science, 1968