Secondary-ion mass-spectrometric studies of the aqueous leaching of a borosilicate waste glass
- 2 October 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 100 (1) , 71-84
- https://doi.org/10.1016/0039-6028(80)90445-8
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- SIMS Analysis of Aqueous Corrosion Profiles in Soda‐Lime‐Silica GlassJournal of the American Ceramic Society, 1979
- Depth profiling of sodium in SiO2 films by secondary ion mass spectrometryApplied Physics Letters, 1978
- Depth profiles of sodium and calcium in glasses: A comparison of secondary ion mass analysis and Auger spectrometryJournal of Vacuum Science and Technology, 1978
- The determination of surface composition profiles in glass by Auger electron spectroscopy and ion etchingJournal of Materials Science, 1977
- Study of Composition of Leached Glass Surfaces by Photoelectron SpectroscopyJournal of the American Ceramic Society, 1975