Advances in crystal orientation mapping with the SEM and TEM
- 1 June 1997
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 67 (1-4) , 19-24
- https://doi.org/10.1016/s0304-3991(97)00010-7
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- On-line Interpretation of Spot and Kikuchi PatternsMaterials Science Forum, 1994
- Orientation imaging: The emergence of a new microscopyMetallurgical Transactions A, 1993
- Graphical Representation of Grain and Hillock Orientations inAnnealed Al–1%Si FilmsTexture, Stress, and Microstructure, 1993
- The Determination of Local Texture by Electron Diffraction–A Tutorial ReviewTexture, Stress, and Microstructure, 1993