Quantitative piezobirefringence studies of dislocations in transparent crystals
- 1 January 1976
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 33 (1) , 173-180
- https://doi.org/10.1080/14786437608221101
Abstract
A technique for the quantitative analysis of piezobirefringent dislocation images in transparent materials is presented. The governing relations for the intensity caused by edge dislocations and background strains are presented for plane and circular polariscopes. By plotting intensity values as half-tone grey scale symbols, subjective matching of experimental and computed images is possible. By careful matching, experimental images may be characterized completelyKeywords
This publication has 2 references indexed in Scilit:
- Birefringence Caused by Edge Dislocations in SiliconPhysical Review B, 1958
- Photographs of the Stress Field Around Edge DislocationsPhysical Review B, 1956