Atom-probe fim studies of β-SiC whiskers
- 1 January 1978
- journal article
- Published by Elsevier in Surface Science
- Vol. 70 (1) , 452-458
- https://doi.org/10.1016/0039-6028(78)90425-9
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- A refined model of the metal surface and its interaction with gases in the field ion microscopeSurface Science, 1968
- The Atom-Probe Field Ion MicroscopeReview of Scientific Instruments, 1968
- Gallium Arsenide Surface Structure and Reaction Kinetics: Field Emission MicroscopyJournal of Applied Physics, 1966