Precisional comparison of surface temperature measurement techniques for GaAs ICs
- 9 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Calibration procedure developed for IR surface-temperature measurementsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1989