In situ observations by synchrotron white beam X-ray topography of the planar, cellular and dendritic growths of a binary alloy
- 14 April 1993
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 26 (4A) , A98-A101
- https://doi.org/10.1088/0022-3727/26/4a/022
Abstract
Real-time X-ray topography using white beam synchrotron radiation has been applied to a study of the planar, cellular and dendritic growths of an Al 0.73 wt.% Cu alloy. In situ observations have revealed two different destabilization modes of the solidification front and have provided information on the microstructures obtained by cellular and dendritic growth.Keywords
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