Real-time x-ray topography on the growth of an Al crystal from melt

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Abstract
Aluminium crystals grown from melt in an ultrahigh vacuum chamber have been observed in situ and in real time by using white synchrotron radiation [experiments were performed at the Laboratoire pour l’Utilisation du Rayonnement Electromagnétique (L. U. R. E.), Bâtiment 209c, 91405 Orsay, France]. The shape of the solid‐liquid interface is determined by the thermal conditions. The defects are generated by strains extraneous to the fusion‐crystallization process. The interfacial area is free from growth dislocations. The dislocations and subboundaries have a tendency to be parallel to the growth axis. Simple 1/2 ‐type dislocations impinge upon the interfacial plane, proving their stability up to the melting point.