Practical aspects of atomic resolution imaging and analysis in STEM
- 30 June 1999
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 78 (1-4) , 125-139
- https://doi.org/10.1016/s0304-3991(99)00018-2
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Direct experimental determination of the atomic structure at internal interfacesJournal of Physics D: Applied Physics, 1996
- High Angle Dark Field STEM for Advanced MaterialsJournal of Electron Microscopy, 1996
- Resolution beyond the 'information limit' in transmission electron microscopyNature, 1995
- Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivityNature, 1993
- Atomic-resolution chemical analysis using a scanning transmission electron microscopeNature, 1993
- Incoherent imaging of thin specimens using coherently scattered electronsProceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences, 1993
- Calibration of the operating parameters for an HB5 stem instrumentUltramicroscopy, 1986
- Electron diffraction phenomena observed with a high resolution STEM instrumentJournal of Electron Microscopy Technique, 1986
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969
- ber einige Fehler von ElektronenlinsenThe European Physical Journal A, 1936