High resolution Auger electron spectroscopy and microscopy of a supported metal catalyst
- 1 February 1992
- journal article
- Published by Elsevier in Surface Science
- Vol. 262 (3) , L111-L117
- https://doi.org/10.1016/0039-6028(92)90118-p
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Auger electron spectroscopy and microscopy with probe-size limited resolutionApplied Physics Letters, 1991
- High-angle ADF and high-resolution SE imaging of supported catalyst clustersUltramicroscopy, 1990
- Catalyst particle sizes from Rutherford scattered intensitiesJournal of Microscopy, 1989
- Biassed secondary electron imaging in a UHV-STEMUltramicroscopy, 1989
- Minimum detectable dimension, resolving power and quantification of scanning Auger microscopy at high lateral resolutionSurface and Interface Analysis, 1989
- Characterization of supported catalysts by high-resolution stemJournal of Molecular Catalysis, 1983
- UHV-SEM study of the nucleation and growth of Ag/W(110)Surface Science, 1983