Imaging the surface of silica microparticles with the atomic force microscope: a novel sample preparation method
- 1 March 1994
- journal article
- Published by Elsevier in Surface Science
- Vol. 304 (1-2) , L393-L399
- https://doi.org/10.1016/0039-6028(94)90739-0
Abstract
No abstract availableKeywords
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