Wavelength Dependence of Excimer Laser Irradiation Effects on Ethylene-Tetrafluoroethylene Copolymer
- 1 August 1994
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 33 (8R) , 4764-4768
- https://doi.org/10.1143/jjap.33.4764
Abstract
Irradiation with an ArF laser at wavelength of 193 nm formed diene in a whole ethylene-tetrafluoroethylene copolymer (ETFE) film and irradiation with a KrF and a XeCl laser at 248 and 308 nm induced the carbonization of ETFE. ArF-laser radiation at 193 nm formed diene in the bulk of ETFE via the process of single-photon absorption, and in case of KrF and XeCl-laser irradiation multiphoton absorption brought about the carbonization of ETFE. The surface analysis by X-ray photoelectron spectroscopy showed that excimer laser-induced elimination of fluorine atoms depended on the laser wavelength.Keywords
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