Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
- 1 March 1990
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 29 (3A) , L502-504
- https://doi.org/10.1143/jjap.29.l502
Abstract
To clarify the origin of the anomalous corrugation height of atomically resolved AFM images of graphite under strong repulsive (contact) force, we carefully investigated the variation of the force between the lever and a graphite surface during lateral scans. For a weak repulsive force (∼1.3×10-7 N), the variation of the force was rather smooth, where the deduced corrugation heights were ∼0.2 Å. On the other hand, for a strong repulsive force (∼2.2×10-6 N), the variation of the force was spikelike, where the maximum corrugation heights of ∼1.7 Å were determined. We also found that the direction of the spikelike force modulation depends on the scanning direction of the sample. Observed variation of the force seems to be evidence that this anomalous large corrugation height of ∼1.7 Å is induced by the stick slip motion between the lever and a graphite surface.Keywords
This publication has 9 references indexed in Scilit:
- Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite SurfaceJapanese Journal of Applied Physics, 1990
- Surface Conductance of Metal Surfaces in Air Studied with a Force MicroscopeJapanese Journal of Applied Physics, 1989
- Atomic resolution with the atomic force microscope on conductors and nonconductorsJournal of Vacuum Science & Technology A, 1988
- Atomic force microscopy using optical interferometryJournal of Vacuum Science & Technology A, 1988
- Atomic resolution atomic force microscopy of graphite and the ‘‘native oxide’’ on siliconJournal of Vacuum Science & Technology A, 1988
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987
- Atomic resolution imaging of a nonconductor by atomic force microscopyJournal of Applied Physics, 1987
- Properties of vacuum tunneling currents: Anomalous barrier heightsIBM Journal of Research and Development, 1986
- Voltage-dependent scanning-tunneling microscopy of a crystal surface: GraphitePhysical Review B, 1985