Analytical characterization of artists' pigments used in old and modern paintings by total-reflection X-ray fluorescence
- 28 February 1993
- journal article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 48 (2) , 239-246
- https://doi.org/10.1016/0584-8547(93)80029-t
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Total reflection X-ray fluorescence—an efficient method for micro-, trace and surface layer analysis. Invited lectureJournal of Analytical Atomic Spectrometry, 1992
- Determination of the critical thickness and the sensitivity for thin-film analysis by total reflection X-ray fluorescence spectrometrySpectrochimica Acta Part B: Atomic Spectroscopy, 1989
- Naturwissenschaftliche Methoden zur Beurteilung von Gem lden und GraphikThe Science of Nature, 1983
- Die Pigmente der antiken MalereiThe Science of Nature, 1982