A novel method to determine the source and drain resistances of individual MOSFETs
- 1 January 1988
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 122-125
- https://doi.org/10.1109/iedm.1988.32768
Abstract
A novel method is presented to determine the bias-dependent series resistances and intrinsic conductance factor of individual MOSFETs. The parameter-extraction procedure can also be applied to groups of scaled transistors to work out the device effective channel length. The method is derived analytically from the conventional theory of ideal MOSFETs, and the deviations of real devices from such a case are studied using two-dimensional device simulations. Experimental results with n- and p-channel conventional and LDD (lightly doped drain) MOSFETs are presented to demonstrate the correctness of the methoKeywords
This publication has 4 references indexed in Scilit:
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- A new method to determine MOSFET channel lengthIEEE Electron Device Letters, 1980