Concentration mapping—a software package for the quantitative determination of two‐dimensional elemental distribution by an electron probe microanalyser

This publication has 4 references indexed in Scilit:

• Computer control of the electron probe microanalyser: The control system and some applications
  X-Ray Spectrometry, 1980
• Correction factors for electron probe microanalysis of silicates, oxides, carbonates, phosphates, and sulfates
  Analytical Chemistry, 1970
• Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides
  The Journal of Geology, 1968
• An Empirical Method for Electron Microanalysis.
  Analytical Chemistry, 1964