Influence of Wet and Dry Ambients on Fast Surface States of Germanium
- 1 July 1961
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 123 (1) , 135-140
- https://doi.org/10.1103/physrev.123.135
Abstract
Simultaneous measurements of surface recombination velocity and added trapped charge density in the fast states as a function of surface potential were carried out on an -type specimen which was subjected to the following gaseous ambient cycles: (a) room air-vacuum, (b) dry air-vacuum, (c) dry oxygen-vacuum, (d) dry nitrogen-vacuum, (e) wet nitrogen-vacuum, and (f) wet oxygen-vacuum. The most important results of these measurements were: (1) Dry nitrogen had no influence whatsoever on any of the surface-state parameters, (2) dry oxygen affected only the density of states and the unperturbed surface potential, and (3) wet nitrogen and wet oxygen had almost the same and most pronounced effect on the fast surface states.
Keywords
This publication has 16 references indexed in Scilit:
- Effect of a Constant Electrical Field on Germanium Fast Surface StatesPhysical Review B, 1961
- The evaluation of germanium surface treatmentsJournal of Physics and Chemistry of Solids, 1960
- Influence of Degeneracy on Recombination Radiation in GermaniumPhysical Review Letters, 1960
- The effect of some surface treatments on the characteristics of fast states on germanium surfacesJournal of Physics and Chemistry of Solids, 1959
- Effect of Various Etches on Recombination Centers at Germanium SurfacesJournal of the Electrochemical Society, 1959
- Feldeffekt und Reaktionen an der Oberfläche von GermaniumAnnalen der Physik, 1959
- High-Vacuum Studies of Surface Recombination Velocity for GermaniumPhysical Review B, 1958
- Recombination Centers and Fast States on Unstable Germanium SurfacesPhysical Review B, 1957
- Distribution and Cross Sections of Fast States on Germanium Surfaces in Different Gaseous AmbientsPhysical Review B, 1957
- Surface Properties of GermaniumBell System Technical Journal, 1953