Measurement of surface photovoltage in high-rate deposited a-Si:H films and comparison with photothermal deflection spectroscopy and conductivity data
- 1 December 1987
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 97-98, 759-762
- https://doi.org/10.1016/0022-3093(87)90179-7
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- A Method for the Measurement of Short Minority Carrier Diffusion Lengths in SemiconductorsJournal of Applied Physics, 1961