Structure of very thin TiO2 films studied by Raman spectroscopy with interference enhancement

Publisher Website

1 September 1986

journal article
Published by Elsevier in Thin Solid Films

Vol. 142 (2) , 193-197
https://doi.org/10.1016/0040-6090(86)90004-0

Abstract

No abstract available

Keywords

RAMAN SPECTROSCOPY

This publication has 5 references indexed in Scilit:

Substrate signal suppression in Raman spectra of sputter deposited TiO2 films
The Journal of Chemical Physics, 1984
Structural characterization of TiO_2 optical coatings by Raman spectroscopy
Applied Optics, 1983
Interference-Enhanced Raman Scattering of Very Thin Titanium and Titanium Oxide Films
Physical Review Letters, 1980
On the optical indices of oxide films as a function of their crystallization: Application to anodic TiO2 (anatase)
Thin Solid Films, 1977
Microanalysis of the stable isotopes of oxygen by means of nuclear reactions
Analytical Chemistry, 1967