Optimum Si-Si1−xGex structures with strong infrared spectra

19 February 1990

journal article
research article
Published by AIP Publishing in Applied Physics Letters

Vol. 56 (8) , 767-769
https://doi.org/10.1063/1.102708

Abstract

We have identified symmetrically strained Si‐Si_1−xGe_x superlattices with optimum strength infrared spectra in the range 50–300 meV. The growth structure parameters required for implementing such systems are provided.

Keywords

This publication has 6 references indexed in Scilit:

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