Thermal conductivity of Cr-doped GaAs at low temperature

Abstract
Below 50 °K, phonon scattering by stacking faults and by very small precipitates (diameter typically 20 Å) is shown to be an important mechanism of the thermal conductivity of Cr : GaAs. The stacking faults are directly observed by x‐ray topography. They appear as the dominant large structural defect. Their association with precipitates is ascribed to the large chromium concentration and to a precipitation which takes place during the growth procedure. The residual optical absorption at 10.6 μ can be attributed to these defects.