Characterization of r.f.-sputtered ZnO thin films by X-ray diffraction and scanning electron microscopy
- 29 August 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 94 (1) , 7-14
- https://doi.org/10.1016/0040-6090(82)90024-4
Abstract
No abstract availableKeywords
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