Raman Investigation of SiC Polytypes
- 1 July 1997
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 162 (1) , 39-64
- https://doi.org/10.1002/1521-396x(199707)162:1<39::aid-pssa39>3.0.co;2-l
Abstract
No abstract availableKeywords
This publication has 44 references indexed in Scilit:
- Electrical and optical characterization of SiCPhysica B: Condensed Matter, 1993
- Raman Scattering on SiC Polytypes –Probe for Evaluation of the Lattice Vibrational Amplitudes–Journal of the Physics Society Japan, 1988
- Raman Scattering from Anisotropic Phonon Modes in SiC PolytypesJournal of the Physics Society Japan, 1987
- Structural Identification of SiC Polytypes by Raman Scattering: 27R and 33R PolytypesJournal of the Physics Society Japan, 1987
- Relative Raman intensities of the folded modes in SiC polytypesPhysical Review B, 1986
- Light scattering by free carrier excitations in semiconductorsPublished by Springer Nature ,1984
- Light Scattering in Solids IPublished by Springer Nature ,1983
- Electronic Raman scatteringPublished by Springer Nature ,1983
- Phonon Dispersion Curves by Raman Scattering in SiC, Polytypes , , , , andPhysical Review B, 1968
- Raman Scattering inSiCPhysical Review B, 1968