A method for depositing well defined metal particles onto a solid sample suitable for static charge referencing in X-ray photoelectron spectroscopy
- 1 January 1989
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 48 (1) , 7-12
- https://doi.org/10.1016/0368-2048(89)80003-9
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Biased referencing experiments for the XPS analysis of non-conducting materialsApplied Surface Science, 1986
- Charge-referencing with Xe during XPS sputter profilesJournal of Electron Spectroscopy and Related Phenomena, 1986
- An appraisal of evaporated gold as an energy reference in X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1985
- Problems of adventitious carbon as an energy referenceJournal of Electron Spectroscopy and Related Phenomena, 1984
- XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energiesSurface and Interface Analysis, 1984
- Problem of evaporated gold as an energy reference in x-ray photoelectron spectroscopyApplications of Surface Science, 1984
- Appraisal of a new charge correction method in x-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1983
- A new charge-correction method in X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1983
- Adventitious carbon—the panacea for energy referencing?Surface and Interface Analysis, 1982
- Quantitative analysis of XPS intensities for supported catalystsThe Journal of Physical Chemistry, 1979