Current oscillations in thin metal–oxide–semiconductor structures observed by ballistic electron emission microscopy
- 1 July 1998
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 16 (4) , 2296-2301
- https://doi.org/10.1116/1.590164
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
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