e-beam-referenced work-function evaluation in an x-ray photoelectron spectrometer
- 23 May 2005
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 97 (11) , 113701
- https://doi.org/10.1063/1.1900296
Abstract
A method for work-function evaluation is proposed, based on recording the shift of x-ray photoelectron signals from a surface irradiated by low-energy electrons. The method is capable of measuring samples with very low conductivity, poor back contacts, and high dielectric constants. The method is also applicable to magnetic materials and can be particularly effective for studies of multilayer and heterogeneous systems.This publication has 16 references indexed in Scilit:
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