Spectroscopic ellipsometry of TiO2 layers prepared by ion-assisted electron-beam evaporation
- 11 February 2000
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 360 (1-2) , 96-102
- https://doi.org/10.1016/s0040-6090(99)00966-9
Abstract
No abstract availableKeywords
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