Structural and optical characterization of self-assembled InAs-GaAs quantum dots grown on high index surfaces
- 31 December 1997
- journal article
- Published by Elsevier in Microelectronics Journal
- Vol. 28 (8-10) , 933-938
- https://doi.org/10.1016/s0026-2692(96)00132-2
Abstract
No abstract availableKeywords
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