A preliminary study of pure metal surfaces using Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS)
- 31 December 1975
- journal article
- Published by Elsevier in Surface Science
- Vol. 53 (1) , 636-648
- https://doi.org/10.1016/0039-6028(75)90160-0
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Auger electron spectroscopyContemporary Physics, 1973
- Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectraAnalytical Chemistry, 1973
- Impurity Segregation to Grain BoundariesJournal of Testing and Evaluation, 1973
- Calculation from first principles of the yield of ions and excited neutral atoms sputtered from metal surfacesSurface Science, 1973
- Investigation of surface layers by SIMS and SIIMSSurface Science, 1973
- Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)Surface Science, 1973
- ESCA: Elektronen‐Spektroskopie für chemische AnalyseAngewandte Chemie, 1972
- Relative intensities and widths of X-ray induced photo-electron signals from different shells in 72 elementsFaraday Discussions of the Chemical Society, 1972
- The role of Auger electron spectroscopy in surface elemental analysisVacuum, 1969
- Untersuchungen zur Emission positiver Sekundärionen aus festen Targets. Die Brauchbarkeit der Ionenbeschuß-Ionenquelle in der MassenspektroskopieZeitschrift für Naturforschung A, 1967