A high temperature X-ray diffractometer for operation up to 2500 C
- 1 November 1966
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 43 (11) , 803-808
- https://doi.org/10.1088/0950-7671/43/11/304
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- An X-ray diffraction study of the variation of the lattice parameters and their ratio for beryllium oxide at temperatures up to 2000° CJournal of Nuclear Materials, 1966
- The X-ray thermal expansion of near-stoichiometric UO2Journal of Nuclear Materials, 1966
- The crystal structure of β-berylliaActa Crystallographica, 1965
- A high temperature crystallographic phase inversion in BeOJournal of Nuclear Materials, 1962
- High-Temperature Phase Transformation in BerylliaNature, 1962
- Adaptation of a Geiger-Counter X-Ray Diffractometer for High-Temperature InvestigationsReview of Scientific Instruments, 1954
- An experimental investigation of extrapolation methods in the derivation of accurate unit-cell dimensions of crystalsProceedings of the Physical Society, 1945