Anomalous resistivity profiles in long silicon crystals grown by the Czochralski method
- 1 June 1973
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 19 (3) , 215-217
- https://doi.org/10.1016/0022-0248(73)90115-2
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- The temperature distribution in pulled germanium crystals during growthSolid-State Electronics, 1964
- Mechanism of the Formation of Donor States in Heat-Treated SiliconPhysical Review B, 1958
- Effect of Heat Treatment upon the Electrical Properties of Silicon CrystalsJournal of Applied Physics, 1957