Image intensity matching technique: Application to the environmental scanning electron microscope
- 1 March 1994
- journal article
- Published by Elsevier in Computational Materials Science
- Vol. 2 (2) , 249-260
- https://doi.org/10.1016/0927-0256(94)90106-6
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
- Image registration by recognition of corresponding structuresIEEE Transactions on Geoscience and Remote Sensing, 1990
- Registering Landsat images by point matchingIEEE Transactions on Geoscience and Remote Sensing, 1989
- A position recognition algorithm for semiconductor alignment based on structural pattern matchingIEEE Transactions on Acoustics, Speech, and Signal Processing, 1989
- Digital Imaging Techniques In Experimental Stress AnalysisOptical Engineering, 1982
- Optimal window functions for image correlation in the presence of geometric distortionIEEE Transactions on Acoustics, Speech, and Signal Processing, 1979
- Image Correlation with Geometric Distortion Part II: Effect on Local AccuracyIEEE Transactions on Aerospace and Electronic Systems, 1978
- Image Correlation with Geometric Distortion Part 1: Acquisition PerformanceIEEE Transactions on Aerospace and Electronic Systems, 1978
- Image Registration Error Variance as a Measure of Overlay QualityIEEE Transactions on Geoscience Electronics, 1976
- A Class of Algorithms for Fast Digital Image RegistrationIEEE Transactions on Computers, 1972
- Optical Area Correlation with Magnification and RotationJournal of the Optical Society of America, 1970