Highly charged ions

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Abstract
This paper reviews some of the fundamental properties of highly charged ions, the methods of producing them (with particular emphasis on table-top devices), and their use as a tool for both basic science and applied technology. Topics discussed include: charge dependence and scaling laws along isoelectronic or isonuclear sequences (for wavefunction size or Bohr radius, ionization energy, dipole transition energy, relativistic fine structure, hyperfine structure, Zeeman effect, Stark effect, line intensities, linewidths, strength of parity violation, etc), changes in angular momentum coupling schemes, selection rules, interactions with surfaces, electron-impact ionization, the electron beam ion trap (EBIT), ion accelerators, atomic reference data, cosmic chronometers, laboratory x-ray astrophysics, vacuum polarization, solar flares, ion implantation, ion lithography, ion microprobes (SIMS and x-ray microscope), nuclear fusion diagnostics, nanotechnology, quantum computing, cancer therapy and biotechnology.