Characterization of Cu/Si(100) interfaces by different surface-sensitive techniques
- 1 March 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 168 (1-3) , 158-163
- https://doi.org/10.1016/0039-6028(86)90846-0
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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