The modification of the electron microscope for special crystallographic applications
- 31 December 1977
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 2 (1) , 43-48
- https://doi.org/10.1016/s0304-3991(76)90314-4
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Selected-Area Diffraction in the Shadow Electron MicroscopeZeitschrift für Naturforschung A, 1976
- Magnification in electron-shadow microscopyJournal of Physics E: Scientific Instruments, 1976
- A practical method of three-dimensional space-group analysis using convergent-beam electron diffractionActa Crystallographica Section A, 1975
- Image formation and contrast from the convergent electron beamPhilosophical Magazine, 1973
- Multipurpose High Resolution Stage for the Electron MicroscopeReview of Scientific Instruments, 1968
- Design and Operation of an Electron Diffraction Camera for the Study of Small Crystalline RegionsReview of Scientific Instruments, 1967
- Elektronenbeugungsuntersuchungen im konvergenten Bündel mit dem Siemens Elmiskop IZeitschrift für Naturforschung A, 1965