Electron Emission from Reverse-Biased p-n Junctions in SiC
- 1 October 1961
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 32 (10) , 2047
- https://doi.org/10.1063/1.1728286
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Electron-Emission Microscope and Velocity Distribution Studies on Silicon Carbide p-n Junction EmittersJournal of Applied Physics, 1961