Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution
- 1 January 1999
- journal article
- Published by Taylor & Francis in Journal of Adhesion Science and Technology
- Vol. 13 (10) , 1155-1164
- https://doi.org/10.1163/156856199x00848
Abstract
Liquid structures on solid substrates have been imaged with a resolution in the nanometer range by scanning force microscopy in the tapping mode. Using Substrates with an artificially patterned wet...Keywords
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