Proton-Induced X-Ray Emission Spectroscopy in Elemental Tsace Analysis
- 1 January 1971
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 15, 373-387
- https://doi.org/10.1154/s037603080001106x
Abstract
Using protons in the MeV range as excitation source and a high resolution Si(Li) detector, X-ray emission spectroscopy is shown to be capable of analysing many elements with Z > 15 simultaneously at the 10-12 g level, This work discusses a theoretical lower limit of detection at moderate proton energies and gives examples of possible applications: analysis of the elemental composition of air-borne particles as a function of particle size, oil slick identification, and analysis of water and blood serum.Keywords
This publication has 9 references indexed in Scilit:
- An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particlesNuclear Instruments and Methods, 1971
- A beam mapping methodNuclear Instruments and Methods, 1971
- Emission Spectrometric Determination of Trace Elements in Biological FluidsApplied Spectroscopy, 1971
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Relative X-ray transition probabilities to the K-shellNuclear Physics A, 1970
- Study of the Production ofX Rays in Ca, Ti, and Ni by 2-28-MeV ProtonsPhysical Review A, 1970
- X-Ray Production Efficiencies for K-, L-, M-, and N-Shell Excitation by Ion ImpactAdvances in X-ray Analysis, 1970
- Photopeak method for the computer analysis of gamma-ray spectra from semiconductor detectorsNuclear Instruments and Methods, 1969
- Size determination of atmospheric phosphate, nitrate, chloride, and ammonium particulate in several urban areasAtmospheric Environment (1967), 1969