W-band on-wafer load-pull measurement system and its application to HEMT characterization
- 27 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 3, 1479-1482
- https://doi.org/10.1109/mwsym.1998.700654
Abstract
No abstract availableKeywords
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- Automated On-Wafer Noise and Load Pull Characterization Using Precision Computer Controlled Electromechanical TunersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1991