Design of testable VLSI circuits with minimum area overhead
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 38 (10) , 1460-1462
- https://doi.org/10.1109/12.35841
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A Knowledge-Based System for Designing Testable VLSI ChipsIEEE Design & Test of Computers, 1985
- Built-In Self-Test StructuresIEEE Design & Test of Computers, 1985
- Design for Testability—A SurveyIEEE Transactions on Computers, 1982