Electronic structure of amorphous Nb1-x Si x films studied by X-ray emission and X-ray photoelectron spectroscopy
- 1 March 1989
- journal article
- Published by Springer Nature in Zeitschrift für Physik B Condensed Matter
- Vol. 75 (1) , 59-65
- https://doi.org/10.1007/bf01313568
Abstract
No abstract availableKeywords
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