The simulation of high resolution images of amorphous thin films
- 31 December 1987
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 21 (2) , 125-130
- https://doi.org/10.1016/0304-3991(87)90079-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Auto-correlation analysis of high resolution electron micrographs of near-amorphous thin filmsUltramicroscopy, 1985
- Computer simulation and interpretation of electron microscopic images of amorphous structuresThe Journal of Physical Chemistry, 1981
- Ultra-high-resolution electron microscopy of amorphous materials at 120 kVPhilosophical Magazine Part B, 1981
- Origin of the fringe structure observed in high resolution bright-field electron micrographs of amorphous materialsPhilosophical Magazine, 1976
- The structure of amorphous Si and GePhilosophical Magazine, 1972