Efficient radiative recombination from ⟨112¯2⟩ -oriented InxGa1−xN multiple quantum wells fabricated by the regrowth technique

Abstract
InxGa1xN multiple quantum wells (QWs) with [0001] , 112¯2 , and 112¯0 orientations have been fabricated by means of the regrowth technique on patterned GaN template with striped geometry, normal planes of which are (0001) and {112¯0} , on sapphire substrates. It was found that photoluminescence intensity of the {112¯2} QW is the strongest among the three QWs, and the internal quantum efficiency of the {112¯2} QW was estimated to be as large as about 40% at room temperature. The radiative recombination lifetime of the {112¯2} QW was about 0.38ns at low temperature, which was 3.8 times shorter than that of conventional [0001] -oriented InxGa1xN QWs emitting at a similar wavelength of about 400nm . These findings strongly suggest the achievement of stronger oscillator strength owing to the suppression of piezoelectric fields.