Thermal and electrical transport formalism for electronic microstructures with many terminals
- 4 June 1990
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 2 (22) , 4869-4878
- https://doi.org/10.1088/0953-8984/2/22/008
Abstract
The Landauer-Buttiker formalism for an electronic microstructure with many terminals is extended to account for temperature changes in the reservoirs and heat fluxes in the terminals. Terminal relations are developed in the presence of an arbitrary applied magnetic induction field which becomes uniform in the neighborhood of each terminal. They use temperature changes in the reservoirs and either chemical potential changes in the reservoirs or charge fluxes in the terminals as independent variables. In both cases formulae for the transport matrices are given in terms of the scattering matrix of the microstructure. Onsager symmetry relations and reciprocity theorems are given for electrical, thermal and thermoelectric configurations. The behaviour of quantum point contacts is outlined.Keywords
This publication has 18 references indexed in Scilit:
- Theory of Quantum Conduction through a ConstrictionPhysical Review Letters, 1989
- Absence of backscattering in the quantum Hall effect in multiprobe conductorsPhysical Review B, 1988
- Symmetry of electrical conductionIBM Journal of Research and Development, 1988
- Fluctuations in the extrinsic conductivity of disordered metalIBM Journal of Research and Development, 1988
- One-dimensional transport and the quantisation of the ballistic resistanceJournal of Physics C: Solid State Physics, 1988
- Quantized conductance of point contacts in a two-dimensional electron gasPhysical Review Letters, 1988
- Four-Terminal Phase-Coherent ConductancePhysical Review Letters, 1986
- Aharonov-Bohm effect in normal metal quantum coherence and transportAdvances in Physics, 1986
- Magnetoresistance Fluctuations in Mesoscopic Wires and RingsPhysical Review Letters, 1985
- Spatial Variation of Currents and Fields Due to Localized Scatterers in Metallic ConductionIBM Journal of Research and Development, 1957